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Program

 

Session I ─ Business Operatives
Time
Topic
Speaker
Association
08:30
Registration
09:00
Opening & Welcome Address Dr. TY Wu
Mr. Thomas Chen
Mr. Terry Tsao
Dr. Jeremy Wang
TSIA
tsmc
SEMI
GSA
09:05
keynote speech ─
Collaborate to Overcome New Design Complexity Barrier
Dr. Shauh-Teh Juang Senior Director, TSMC
09:50
Integrated Innovation and Collaboration in a Semiconductor Disintegrated Ecosystem Dr. Jaushin Lee President and CEO, Imera Systems
10:20
tea break

10:40

Enablers for Manufacturing Technology Integration Mr. Reiner Missale CEO, Critical Manufacturing S.A.
11:10
IP Royalty management in Semiconductor Industry Mr. K Saj Kumar Vice Presiden of Hi-Tech Industry, SAP APJ
11:40
Achieving optimal efficiencies of vertical integrations along a horizontal supply chain Mr. John Cheng Director of supply chain management, Verigy Ltd
12:10
lunch break
Session II ─ Technology Operatives
13:30
keynote speech ─
Globalization and Innovation
Mr. Ron Kao General Manager, Broadcom Taiwan Design Center & Asia Business Development
14:15
A Pattern-Based Design Platform for High Manufacturability Dr. Kimon W. Michaels VP  Design for Manufacturability, PDF Solutions, Inc.
14:45
Gaining a Competitive Advantage with DFM Ms. Shu-Wen Chang Foundry Program Manager, Mentor Graphics Taiwan
15:15
End-to-End Product Information Integration for the Semiconductor Industry Mr. You-Min Lin Business Consultant, Siemens PLM Software
15:45
tea break
16:05
Yield Mine for WAT Issue Investigation Wei Jun Chen Inotera
16:35
A modified PLS based d-EWMA controller for furnace process James Yang Nanya Technology Corporation
17:05
A Study of Virtual Metrology for ETCH process in Semiconductor Manufacturing Ferna Huang ProMOS

 

Poster

  • The Advanced Root Cause Finding System in Semiconductor Field

    • Yi Feng Lee, Shih-Chang Kao, Yun Zong Tien, Chun Chi Chen, Chih Yung Yang and Yu Sheng Hsu
    • Inotera Memories, Inc.
  • Self-tuning Interlayer Dielectric Gap Fill Process

    • Sheng-Hui Hsieh, Shing-Ann Luo, Tuung Luoh*, Chin-Ta Su, Ta-Hung Yang, Kuang-Chao Chen and Chih-Yuan Lu
    • Macronix International Co. Ltd., Technology Development Center
  • Defect Management with WIP and Care Area in the Fab

    • Jun-Wei Huang1; Yu-Min Lu1; Kevin Hsiao1; David Tseng2
    • 1Nanya Technology Corp;2KLA-Tencor Corporation
  • Automated Multivariate Analysis for Yield Issue Investigation

    • Wen-Hua Lu1, Ellery Tsai1, Wen-Hung Lien1, Wen-Chieh Tsai1, Wei-Hsi Wang1, Chin-Lun Ke1, Cheng-Wei Liang1, Bruce Lu2, Jack Huang2, Johan Hultman2, Mingyu Lu2
    • 1Winbond Electronics Corp., 2MKS Instruments